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Communication Dans Un Congrès Année : 2014

Cluster matching in time resolved imaging for VLSI analysis

Résumé

If scaling has the benefit of enabling manufacturers to design tomorrow's integrated circuits, from the failure analyst point of view it also has the drawback of making devices more complex. The test sequence for modern VLSI can be quite long, with thousands of vector. Dynamic photon emission databases can contain millions of photons representing thousands of state changes in the region of interest. Finding a candidate location where to perform physical analysis is quite challenging, especially if the fault occurs on a single vector. In this paper, we suggest a new methodology to find single vector fault in dynamic photon emission database. The process is applied at the post-acquisition level and is based on clustering algorithm and nearest neighbor research.
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Dates et versions

hal-01073209 , version 1 (09-10-2014)

Identifiants

  • HAL Id : hal-01073209 , version 1

Citer

Samuel Chef, Sabir Jacquir, Philippe Perdu, Kevin Sanchez, Stéphane Binczak. Cluster matching in time resolved imaging for VLSI analysis. IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.379-382. ⟨hal-01073209⟩
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