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Dark Count rate measurement in Geiger mode and simulation of a photodiode array, with CMOS 0.35 technology and transistor quenching.7th international conference on New Developments in Photodetection, Jun 2014, Tours, France
Communication dans un congrès
hal-01196632v1
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Single-Photon Avalanche Diodes (SPAD) in CMOS 0.35 µm technologyNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2015, 787, pp.380-385. ⟨10.1016/j.nima.2015.01.100⟩
Article dans une revue
hal-01196570v1
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