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Cluster matching in time resolved imaging for VLSI analysisIEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.379-382
Communication dans un congrès
hal-01073209v1
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Frequency mapping in dynamic light emission with wavelet transformMicroelectronics Reliability, 2013, 53 (9), pp.1387-1392
Article dans une revue
hal-00874178v1
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Automatic emission spots identification in static and dynamic imaging by research of local maxima.ISTFA: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, Nov 2014, Houston, United States. pp.332-326
Communication dans un congrès
hal-01465720v1
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New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, Suzhou, China. pp.140-145
Communication dans un congrès
hal-00860841v1
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Spatial correction in dynamic photon emission by affine transformation matrix estimationIEEE 21st Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.118-122
Communication dans un congrès
hal-01073233v1
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Filtering and emission area identification in the Time Resolved Imaging data38th International Symposium for Test and Failure Analysis (ISTFA), Nov 2012, Phoenix, United States. pp 264-272
Communication dans un congrès
hal-00788731v1
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Pattern image enhancement by extended depth of fieldMicroelectronics Reliability, 2014, 54 (9-10), pp.2099-2104
Article dans une revue
hal-01079552v1
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Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect locationJournal of Electronic Imaging, 2015, 24 (1), pp.013019-1 013019-12. ⟨10.1117/1.JEI.24.1.013019⟩
Article dans une revue
hal-01117572v1
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Automatic localization of signal sources in photon emission images for integrated circuit analysisSignal, Image and Video Processing, 2018, 12 (4), pp.775 - 782. ⟨10.1007/s11760-017-1219-z⟩
Article dans une revue
hal-01861306v1
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Automatic process for time-frequency scan of VLSIMicroelectronics Reliability, 2016, Proceedings of the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 64, pp.299-305. ⟨10.1016/j.microrel.2016.07.052⟩
Article dans une revue
hal-01465737v1
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Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theoryInformation Fusion, At Xi'an, China, Jul 2017, Xi'an, China
Communication dans un congrès
hal-01564417v1
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Optical Probing (EOFM/TRI): A large set of complementary applications for ultimate VLSI20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, France. pp.123-130
Communication dans un congrès
hal-00860858v1
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