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authFullName_s : Philippe Perdu

Cluster matching in time resolved imaging for VLSI analysis

Samuel Chef , Sabir Jacquir , Philippe Perdu , Kevin Sanchez , Stéphane Binczak et al.
IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.379-382
Communication dans un congrès hal-01073209v1

Frequency mapping in dynamic light emission with wavelet transform

Samuel Chef , Sabir Jacquir , Kevin Sanchez , Philippe Perdu , Stéphane Binczak et al.
Microelectronics Reliability, 2013, 53 (9), pp.1387-1392
Article dans une revue hal-00874178v1

Automatic emission spots identification in static and dynamic imaging by research of local maxima.

Anthony Boscaro , Sabir Jacquir , Kévin Sanchez , Philippe Perdu , Stéphane Binczak et al.
ISTFA: Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis, Nov 2014, Houston, United States. pp.332-326
Communication dans un congrès hal-01465720v1

New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI

Samuel Chef , Philippe Perdu , Guillaume Bascoul , Sabir Jacquir , Kevin Sanchez et al.
20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, Suzhou, China. pp.140-145
Communication dans un congrès hal-00860841v1

Spatial correction in dynamic photon emission by affine transformation matrix estimation

Samuel Chef , Sabir Jacquir , Philippe Perdu , Kevin Sanchez , Stéphane Binczak et al.
IEEE 21st Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.118-122
Communication dans un congrès hal-01073233v1

Filtering and emission area identification in the Time Resolved Imaging data

Samuel Chef , Sabir Jacquir , Kevin Sanchez , Philippe Perdu , Stéphane Binczak et al.
38th International Symposium for Test and Failure Analysis (ISTFA), Nov 2012, Phoenix, United States. pp 264-272
Communication dans un congrès hal-00788731v1

Pattern image enhancement by extended depth of field

Samuel Chef , Bastien Billiot , Sabir Jacquir , Kevin Sanchez , Philippe Perdu et al.
Microelectronics Reliability, 2014, 54 (9-10), pp.2099-2104
Article dans une revue hal-01079552v1

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location

Samuel Chef , Sabir Jacquir , Kevin Sanchez , Philippe Perdu , Stéphane Binczak et al.
Journal of Electronic Imaging, 2015, 24 (1), pp.013019-1 013019-12. ⟨10.1117/1.JEI.24.1.013019⟩
Article dans une revue hal-01117572v1

Automatic localization of signal sources in photon emission images for integrated circuit analysis

Anthony Boscaro , Sabir Jacquir , Samuel Chef , Kevin Sanchez , Philippe Perdu et al.
Signal, Image and Video Processing, 2018, 12 (4), pp.775 - 782. ⟨10.1007/s11760-017-1219-z⟩
Article dans une revue hal-01861306v1
Image document

Automatic process for time-frequency scan of VLSI

Anthony Boscaro , Sabir Jacquir , Kevin Melendez , Kevin Sanchez , Philippe Perdu et al.
Microelectronics Reliability, 2016, Proceedings of the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 64, pp.299-305. ⟨10.1016/j.microrel.2016.07.052⟩
Article dans une revue hal-01465737v1

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory

Anthony Boscaro , Sabir Jacquir , Kevin Sanchez , Philippe Perdu , Stéphane Binczak et al.
Information Fusion, At Xi'an, China, Jul 2017, Xi'an, China
Communication dans un congrès hal-01564417v1

Optical Probing (EOFM/TRI): A large set of complementary applications for ultimate VLSI

Philippe Perdu , Guillaume Bascoul , Samuel Chef , Guillaume Celi , Kevin Sanchez et al.
20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, France. pp.123-130
Communication dans un congrès hal-00860858v1