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Frequency mapping in dynamic light emission with wavelet transformMicroelectronics Reliability, 2013, 53 (9), pp.1387-1392
Article dans une revue
hal-00874178v1
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Cluster matching in time resolved imaging for VLSI analysisIEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.379-382
Communication dans un congrès
hal-01073209v1
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New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, Suzhou, China. pp.140-145
Communication dans un congrès
hal-00860841v1
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Spatial correction in dynamic photon emission by affine transformation matrix estimationIEEE 21st Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.118-122
Communication dans un congrès
hal-01073233v1
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Filtering and emission area identification in the Time Resolved Imaging data38th International Symposium for Test and Failure Analysis (ISTFA), Nov 2012, Phoenix, United States. pp 264-272
Communication dans un congrès
hal-00788731v1
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Pattern image enhancement by extended depth of fieldMicroelectronics Reliability, 2014, 54 (9-10), pp.2099-2104
Article dans une revue
hal-01079552v1
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Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect locationJournal of Electronic Imaging, 2015, 24 (1), pp.013019-1 013019-12. ⟨10.1117/1.JEI.24.1.013019⟩
Article dans une revue
hal-01117572v1
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Optical Probing (EOFM/TRI): A large set of complementary applications for ultimate VLSI20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, France. pp.123-130
Communication dans un congrès
hal-00860858v1
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