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Auteur : personID (entier) : 759235

Frequency mapping in dynamic light emission with wavelet transform

Samuel Chef , Sabir Jacquir , Kevin Sanchez , Philippe Perdu , Stéphane Binczak et al.
Microelectronics Reliability, 2013, 53 (9), pp.1387-1392
Article dans une revue hal-00874178v1

Cluster matching in time resolved imaging for VLSI analysis

Samuel Chef , Sabir Jacquir , Philippe Perdu , Kevin Sanchez , Stéphane Binczak et al.
IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.379-382
Communication dans un congrès hal-01073209v1

New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI

Samuel Chef , Philippe Perdu , Guillaume Bascoul , Sabir Jacquir , Kevin Sanchez et al.
20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, Suzhou, China. pp.140-145
Communication dans un congrès hal-00860841v1

Spatial correction in dynamic photon emission by affine transformation matrix estimation

Samuel Chef , Sabir Jacquir , Philippe Perdu , Kevin Sanchez , Stéphane Binczak et al.
IEEE 21st Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jun 2014, Singapore. pp.118-122
Communication dans un congrès hal-01073233v1

Filtering and emission area identification in the Time Resolved Imaging data

Samuel Chef , Sabir Jacquir , Kevin Sanchez , Philippe Perdu , Stéphane Binczak et al.
38th International Symposium for Test and Failure Analysis (ISTFA), Nov 2012, Phoenix, United States. pp 264-272
Communication dans un congrès hal-00788731v1

Pattern image enhancement by extended depth of field

Samuel Chef , Bastien Billiot , Sabir Jacquir , Kevin Sanchez , Philippe Perdu et al.
Microelectronics Reliability, 2014, 54 (9-10), pp.2099-2104
Article dans une revue hal-01079552v1

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location

Samuel Chef , Sabir Jacquir , Kevin Sanchez , Philippe Perdu , Stéphane Binczak et al.
Journal of Electronic Imaging, 2015, 24 (1), pp.013019-1 013019-12. ⟨10.1117/1.JEI.24.1.013019⟩
Article dans une revue hal-01117572v1

Optical Probing (EOFM/TRI): A large set of complementary applications for ultimate VLSI

Philippe Perdu , Guillaume Bascoul , Samuel Chef , Guillaume Celi , Kevin Sanchez et al.
20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013), Jul 2013, France. pp.123-130
Communication dans un congrès hal-00860858v1