Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory
Résumé
Defect localization in Very Large Integration Cir-
cuits (VLSI) requires to use multi-sensor information such as
electrical waveforms, emission microscopy images and frequency
mapping in order to detect, localize and identify the failure. Each
sensor provides a specific kind of feature modeling the evidence.
Thus, the defect localization in VLSI can be summarized as
a problem of data fusion with heterogeneous and imprecise
information. This study illustrates how to reproduce the human
decision for modeling and fusing the different multi-sensor
features by using the Demspter-Shafer theory. We propose not
only an automatic decision rule for mass functions computing
but also confidence intervals to quantify the final decision and to
bring a decision help for the analysts expertise. Finally, a case
of study is reported to attest the expert decision reproducibility