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Communication Dans Un Congrès Année : 2017

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory

Résumé

Defect localization in Very Large Integration Cir- cuits (VLSI) requires to use multi-sensor information such as electrical waveforms, emission microscopy images and frequency mapping in order to detect, localize and identify the failure. Each sensor provides a specific kind of feature modeling the evidence. Thus, the defect localization in VLSI can be summarized as a problem of data fusion with heterogeneous and imprecise information. This study illustrates how to reproduce the human decision for modeling and fusing the different multi-sensor features by using the Demspter-Shafer theory. We propose not only an automatic decision rule for mass functions computing but also confidence intervals to quantify the final decision and to bring a decision help for the analysts expertise. Finally, a case of study is reported to attest the expert decision reproducibility
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Dates et versions

hal-01564417 , version 1 (18-07-2017)

Identifiants

  • HAL Id : hal-01564417 , version 1

Citer

Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak. Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory: Automatic defect localization in VLSI circuits. Information Fusion, At Xi'an, China, Jul 2017, Xi'an, China. ⟨hal-01564417⟩
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